New Scanning Electron Microscope with 'Simple SEM' Automation, 3D Analysis – Lab Manager Magazine
The IT510 is the successor to the popular JEOL IT500 InTouchScope SEM, with its large sample chamber and tungsten or LaB6 filament.
A new Scanning Electron Microscope (SEM) from JEOL answers the need for faster and easier acquisition of both SEM images and EDS data analysis, especially suited for repetitive operations and quality control.
JEOL, the global leader in the development of cutting-edge Electron Microscopes for materials characterization and analysis, introduces its latest SEM, the JSM-IT510. This new Scanning Electron Microscope features productivity enhancing automation, including “Simple SEM” automated imaging, automated montaging (both image and EDS map), and live EDS analysis (spectrum and map).
The IT510 is the successor to the popular JEOL IT500 InTouchScope SEM, with its large sample chamber and tungsten or LaB6 filament. The IT510 features JEOL Intelligent Technology that enables seamless navigation from optical to SEM imaging, Live EDS and 3D analysis, and auto functions from alignment to focus for fast, clear, and sharp images.
The user of the new IT510 has several productivity-enhancing new features:
The JEOL IT510 is designed for unprecedented ease-of-use with advanced SEM technology in a compact platform. This smart-flexible-powerful Scanning Electron Microscope delivers the highest level of intelligent technology with built-in automation for the most versatile analytical SEM available today.
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